Category Archive: Process Control

Feb
23

Exploring Dubai

When I traveled to Dubai in November, 2014 to teach the Control Loop Foundation classes (see Februry 16th, 2015 post) it was my first time to visit Dubai. To say the least, I was quite impressed by the city layout, planning and quality of construction. It is by far the most modern city I have …

Continue reading »

Feb
16

Control Classes – Dubai

Emerson Employees that Attended the Dubai Training Class

In late November, 2014 I traveled to Dubai to teach the Control Loop Foundation class. This class is based on the book Control Loop Foundation – Batch and Continuous Processes and is a standard class offered by Emerson’s education department. In this class the students used the book’s web site to perform the workshops that …

Continue reading »

Dec
15

Wireless for Control

At Emerson Exchange, 2014 I participated in technology forum panel discussion on control using wireless measurements and valves . The panelists were: Terry Blevins, Principal Technologist, Emerson Process Management Scott Broadley, President, Broadley-James Corporation Mitch Panther, Senior Design Engineer, Fisher Controls Bailee Roach, PhD Candidate, University of Texas at Austin Eric Rotvold, Distinguished Technologist, Rosemount …

Continue reading »

Dec
08

Using Wireless Throttling Valves in Column Control

At Emerson Exchange 2014 I worked with Stephen Briggs, University Of Texas, Austin and Kurtis Jensen, Emerson Process Management, to co-host a workshop on control using a wireless throttling valve. As addressed in this presentation, we have tested in a flow lab the control performance that may be achieved using PIDPlus with a wireless throttling …

Continue reading »

Dec
01

Wireless Model Predictive Control

Wirelss MPC Workshop

At Emerson Exchange – 2014, Orlando, FL. I worked with Bailee Roach, University Of Texas, Austin and Willy Wojsznis, Emerson Process Management to co-host a workshop of Wireless Model Predictive Control (MPC). In this workshop we addressed how wireless measurements may be used in model predictive. Information was provided on a field trail of this …

Continue reading »

Sep
22

Emerson Exchange 2014

Gaylord Photo

This year Emerson Exchange will be held October 6 – 10, 2014 at the Gaylord Palms Resort & Convention Center, Orlando, Florida. More than 400 Workshops and Short Courses are planned this year. I am a presenter in the following workshops that focus on control using wireless field devices. 4-1892 Using Wireless Throttling Valves in …

Continue reading »

Jun
09

Wireless Control Presentation – ACC 2014

OLYMPUS DIGITAL CAMERA

This last week I gave a paper presentation at the American Control Conference, Portland, OR. The topic of this paper was PID Control Using Wireless Measurements. I co-authored the paper with Mark Nixon and Willy Wojsznis. Below is a picture taken during the presentation. This paper presents a wireless PID controller, known as PIDPlus. The …

Continue reading »

May
05

Control Loop Foundation Reprint

Manual Tuning Integrating Process

A book goes through many reviews and edits before it can be published. Still, it is very difficult for the authors and reviewers to catch all the typo’s in the original text and those that are introduced during the type setting process (formatting for publication). ISA recently notified me that the book that Mark Nixon …

Continue reading »

Apr
14

IEC TC65 Standards Work

IEC Webstore

The international standards for industrial-process measurement, control and automation are developed through IEC TC65. As stated on the IEC web site, the standards developed by TC65 address systems and elements used for industrial-process measurement and control concerning continuous and batch processes. These standards address equipment and systems operating with electrical, pneumatic, hydraulic, mechanical or other …

Continue reading »

Apr
07

TC65 Plenary Meeting

SC65E Meeting Hamburg Germany

Many of the international standards that we depend on in the process industry were created by working groups within IEC TC65: Industrial-process measurement, control and automation. IEC TC65 holds a plenary meeting every two years to review the status of work to develop or update international standards. The most recent plenary meeting was held March …

Continue reading »

Older posts «